T01-01 | Evaluation of Optimality Criteria for Efficient Reliability Demonstration Testing
Thomas Herzig, Martin Dazer, Alexander Grundler and Bernd Bertsche |
T01-02 | Reliability Prediction using Design of Experiments
Alexander Kremer, Levente Dücsö and Bernd Bertsche |
T01-03 | Bias Corrected Weibull Parameter Estimation and Impact on Confidence Bounds
Tamer Tevetoglu and Bernd Bertsche |
T01-04 | Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data
Zdenek Vintr, Xuan Phong Cu and Cao Vu Tran |
T01-05 | Research on Accelerated Degradation Test of Aero-generator Based on Text Mining
Yao Jinyong and Wei Shuochen |
T01-06 | An Approach to Predict the Lifetime of Shape Memory Actuators based on Accelerated Testing Measurements
Philipp Heß and Stefan Bracke |
T01-07 | Reliability Estimation by Usage Rate Method Varying the Quantity of Warranty Data Censored
Eugenio Zappa Neto, Gilberto Fransciso Martha de Souza and Messias Borges Silva |
T01-08 | An Accelerated Life Test and Reliability Evaluation Method on Ultrasonic Motors Under Increased Torque Load
Shouqing Huang, Jiacheng Guo, Tengfei Ma, Shouwen Liu and Yun Jia |
T01-09 | Research on Identification Method of Bearing Performance Degradation in NPP Based on GG Clustering
Zhang Jiyu, Xia Hong and Wang Zhichao |
T01-10 | Research on Burn-in Technology of SiP
TianRui Zhu, Lei Chen and YiFei Han |
